An Automatic Offset Calibration Method for Differential Charge-Based Capacitance Measurement

Charge-Based Capacitance Measurement (CBCM) technique is a simple but effective for measuring capacitance values down to the attofarad level. However, when adopted fully on-chip implementation, this suffers output offset caused by mismatches and process variations. This paper introduces novel method that compensates of integrated differential CBCM electronic front-end. After detailed theoretical analysis topology, we present discuss modified architecture increases robustness against The proposed circuit has been simulated using standard 130-nm technology shows sensitivity 1.3 mV/aF 20× reduction deviation voltage as compared traditional solution.